Hf-Based High-k Dielectrics: Process Development, Performance Characterization and Reliability (Record no. 34489)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00697nam a2200169Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 140223b2005 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781598293548 |
| Terms of availability | 0.00 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 537.24 |
| Item number | KIM |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Kim, Young-Hee |
| 245 ## - TITLE STATEMENT | |
| Title | Hf-Based High-k Dielectrics: Process Development, Performance Characterization and Reliability |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | USA |
| Name of publisher, distributor, etc. | Morgan & Claypool Publshers |
| Date of publication, distribution, etc. | 2005 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 92p |
| 600 ## - SUBJECT ADDED ENTRY--PERSONAL NAME | |
| Personal name | Electronic Engineering |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Lee, Jack C. |
| 890 ## - | |
| -- | USA |
| 995 ## - RECOMMENDATION 995 [LOCAL, UNIMARC FRANCE] | |
| -- | KIM |
| -- | 007797 |
| -- | ECT-NIT |
| -- | 1032.30 |
| -- | 0 |
| -- | 049 |
| -- | 4332 |
| -- | 0 |
| -- | 0.00 |
| -- | 1395.00 26% |
| -- | 20081006 |
| -- | 16 |
| -- | C |
| -- | 20081014 |
| -- | Mahajan Book Depot |
| -- | General |
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