MOS (Metal Oxide Semiconductor): Physics and Technology (Record no. 47660)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01315nam a2200181Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 140223b2003 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780471430797 |
| Terms of availability | 0.00 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 |
| Item number | NIC |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Nicollian, E. H. |
| 245 ## - TITLE STATEMENT | |
| Title | MOS (Metal Oxide Semiconductor): Physics and Technology |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | New York |
| Name of publisher, distributor, etc. | John Wiley & Sons, Inc. |
| Date of publication, distribution, etc. | 2003 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 906p |
| 500 ## - GENERAL NOTE | |
| General note | Introduction Field Effect Metal Oxide Sillicon Capacitor at Low Frequencies Metal Oxide Sillicon Capacitor at Intermediate and High Frequencies Extraction of Interface Trap Properties from the Conductance Interfacial Nonuniformities Experimental Evidence for Interface Trap Properties Extraction of Interface Trap Properties from the Capacitance Measurement of Sillicon Properties Charges, Barrier Heights and Flatband Voltage Charge Trapping in the Oxide Instrumentation for Measuring Capacitor Characteristics Oxidation of Sillicon Oxidation Kinetics Oxidation of Sillicon Technology Control of Oxide Charges Models of the Interface |
| 600 ## - SUBJECT ADDED ENTRY--PERSONAL NAME | |
| Personal name | Mechanical Engineering |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Brews, J. R. |
| 890 ## - | |
| -- | USA |
| 995 ## - RECOMMENDATION 995 [LOCAL, UNIMARC FRANCE] | |
| -- | NIC |
| -- | 001761 |
| -- | ECE-PG0 |
| -- | 3775.21 |
| -- | 0 |
| -- | 049 |
| -- | 082087 |
| -- | 0 |
| -- | 0.00 |
| -- | 4719.01 20% |
| -- | 1 |
| -- | C |
| -- | 20030711 |
| -- | Himanshu Book Co. |
| -- | Reference |
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