Semiconductor Material and Device Characterization
Material type:
- 9780471241393
- 621.38152 SCH
Item type | Current library | Item location | Collection | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|---|
![]() |
NIMA Knowledge Centre | 6th Floor Silence Zone | Reference | 621.38152 SCH (Browse shelf(Opens below)) | Not For Loan | T0017014 |
Total holds: 0
Browsing Institute of Technology shelves, Collection: Reference Close shelf browser (Hides shelf browser)
No cover image available |
![]() |
![]() |
![]() |
![]() |
![]() |
![]() |
||
621.38152 OPT Optoelectronic Device Data | 621.38152 PIE Advanced Semiconductor Fundamentals: Modular Series on Solid State Devices Vol - 6 | 621.38152 ROC The Materials Science of Semiconductors | 621.38152 SCH Semiconductor Material and Device Characterization | 621.38152 SEL Analysis and Simulation of Semiconductor Devices | 621.38152021 UPT Up to Date Emitters and Optocouplers: Data and Comparison Tables Cqs 51...Yl-56 Brt 11H 5400/005 | 621.381522 SCH Light Emitting Diodes |
Resistivity Carrier and Doping Density Contact Resistance, Schottky Barriers and Electromigration Series Resistance, Channel Length and Width Threshold Voltage and Hot Carriers Defects Oxide and Interface Trapped Charges, Oxide Integrity Carrier Lifetime Mobility Optical Characterization Chemical and Physical Characterization
There are no comments on this title.
Log in to your account to post a comment.