VLSI Test Principles and Architecture Design for Testability
Material type:
- 9780123705976
- 621.395 VLS
Item type | Current library | Item location | Collection | Call number | Status | Date due | Barcode | Item holds | |
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NIMA Knowledge Centre | 6th Floor Silence Zone | Reference | 621.395 VLS (Browse shelf(Opens below)) | Not For Loan | T0031790 |
Total holds: 0
Introduction Design for Testability Logic and Fault Simulation Test Generation Logic Built in Self Test Test Compression Logic Diagnosis Memory Testing and Built In Self Test Memory Diagnosis and Built In Self Repair Boundary Scan and Core Based Testing Analog and Mixed Signal Testing Test Technology Trends in the Nanometer Age
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