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VLSI Test Principles and Architecture Design for Testability

By: Contributor(s): Material type: TextTextPublication details: San Francisco Morgan Kaufmann Publishers 2006Description: 777pISBN:
  • 9780123705976
Subject(s): DDC classification:
  • 621.395 VLS
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Item type Current library Item location Collection Call number Status Date due Barcode Item holds
Reference Book Reference Book NIMA Knowledge Centre 6th Floor Silence Zone Reference 621.395 VLS (Browse shelf(Opens below)) Not For Loan T0031790
Total holds: 0

Introduction Design for Testability Logic and Fault Simulation Test Generation Logic Built in Self Test Test Compression Logic Diagnosis Memory Testing and Built In Self Test Memory Diagnosis and Built In Self Repair Boundary Scan and Core Based Testing Analog and Mixed Signal Testing Test Technology Trends in the Nanometer Age

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