VLSI Test Principles and Architecture Design for Testability

By:

Wang, Laung Terng

Contributor(s):

Material type: Text

TextPublication details: San Francisco Morgan Kaufmann Publishers 2006Description: 777pISBN:

9780123705976

Subject(s):

Electronic Engineering

DDC classification:

621.395 VLS

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Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	6th Floor Silence Zone	Reference	621.395 VLS (Browse shelf(Opens below))	Not For Loan		T0031790

Total holds: 0

Introduction Design for Testability Logic and Fault Simulation Test Generation Logic Built in Self Test Test Compression Logic Diagnosis Memory Testing and Built In Self Test Memory Diagnosis and Built In Self Repair Boundary Scan and Core Based Testing Analog and Mixed Signal Testing Test Technology Trends in the Nanometer Age

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