Integrated Circuit Manufacturability: The Art of Process and Design Integration

By:

Gyvez, Jose Pineda de

Contributor(s):

Pradhan, Dhiraj

Material type: Text

TextPublication details: New York IEEE Press 1999Description: 316pISBN:

9780780334472

Subject(s):

Electronic Engineering

DDC classification:

621.3815 INT

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Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	6th Floor Silence Zone	Reference	621.3815 INT (Browse shelf(Opens below))	Not For Loan		T0023615

Total holds: 0

Introduction Defect Monitoring and Characterization Digital CMOS Fault Modeling and Inductive Fault Analysis Functional Yield Modeling Critical Area and Fault Probability Prediction Statistical Methods of Parametric Yield and Quality Enhancement Architectural Fault Tolerance Design for Test and Manufacturability Testing Solutions for MCM Manufacturing

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