Characterization of Organic Thin Films

By:

Ulman, Abraham

Contributor(s):

Material type: Text

TextSeries: Materials Characterization SeriesPublication details: New York Momentum Press 2010Description: 276pISBN:

9781606500446

Subject(s):

Chemical Engineering

DDC classification:

530.4175 CHA

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Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	7th Floor Silence Zone	Reference	530.4175 CHA (Browse shelf(Opens below))	Not For Loan		T0041493

Total holds: 0

Part - 1: Preparation and Materials Langmuir Blodgett Films Self Assembled Monolayers Part - 2: Analysis of Film ans Surface Properties Spectroscopic Ellipsometry Infrared Spectroscopy in the Characterization of Organic Thin Films Raman Spectroscopic Characterization of Organic Thin Films Surface Potential X Ray Differaction High Resolution EELS Studies of Organic Thin Films and Surfaces Wetting Secondary Ion Mass Spectrometry As Applied to Thin Oganic and Polymeric Films X Ray Photoelectron Spectroscopy of Organic Thin Films Molecular Orientation in Thin Films as Probed by Optical Second Harmonic Generation Appendix: Technique Summaries Index

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