Design for Test for Digital IC's and Embedded Core Systems

By:

Crouch, Alfred L

Material type: Text

TextPublication details: New Jersey Prentice-Hall, Inc. 2000Description: 349pISBN:

9780130848277

Subject(s):

Electronic Engineering

DDC classification:

621.3815 CRO

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Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	6th Floor Silence Zone	Reference	621.3815 CRO (Browse shelf(Opens below))	Not For Loan		T0023414

Total holds: 0

TCG01013 Test and Design for Test Fundamentals Automatic Test Pattern Generation Fundamentals Scan Architectures and Techniques Memory Test Architectures and Techniques Embedded Core Test Fundamentals

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