Amazon cover image
Image from Amazon.com

Nanometer Technology Designs High-Quality Delay Tests

By: Contributor(s): Material type: TextTextPublication details: New York Springer Science+Business Media, Inc 2008Description: 281pISBN:
  • 9780387764863
Subject(s): DDC classification:
  • 621.3950287 TEH
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Item location Collection Call number Status Date due Barcode Item holds
Reference Book Reference Book NIMA Knowledge Centre 6th Floor Silence Zone Reference 621.3950287 TEH (Browse shelf(Opens below)) Not For Loan T0037542
Total holds: 0

Introduction At speed Test Challenges for Nanometer Technology Designs Local At-Speed Scan Enable Generation using Low - Cost Testers Enhanced Launch off Capture Hybrid Scan Based Transition Delay Test Avoiding Functionally Untestable Faults Screening Small Delay Defects Faster Than At Speed Test Considering IR-Drop Effects IR-Drop Tolerant At speed Test Pattern Generation Pattern Generation for Power Supply Noise Analysis Delay Fault Testing in Presence of Maximum Crosstalk Testing SoC Interconnects for Signal Integrity Index

There are no comments on this title.

to post a comment.
© 2025 by NIMA Knowledge Centre, Ahmedabad.
Koha version 24.05