Design for Test for Digital IC's and Embedded Core Systems

By:

Crouch, Alfred L

Material type: Text

TextPublication details: New Jersey Prentice-Hall, Inc. 2000Description: 349pISBN:

9780130848277

Subject(s):

Electronic Engineering

DDC classification:

621.3815 CRO

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Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	6th Floor Silence Zone	Reference	621.3815 CRO (Browse shelf(Opens below))	Not For Loan		T0023414

Total holds: 0

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Previous	621.3815 CAV CMOS RFIC Design Principles	621.3815 CMO INTEL: CMOS INtegrated Circuits	621.3815 COO Introductory DC/AC Circuits	621.3815 CRO Design for Test for Digital IC's and Embedded Core Systems	621.3815 CUT Electronic Circuits for the Evil Genius: 64 Lessons with Projects	621.3815 DAI Electronic Devices and Circuits: Discrete and Integrated	621.3815 DAT Embedded Microcontrollers and Processor Vol - 1	Next

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