Testing of Digital Systems

By:

Jha, N. K

Contributor(s):

Gupta, S

Material type: Text

TextPublication details: Cambridge Cambridge University Press 2003Description: 1000pISBN:

9780521773560

Subject(s):

Electronic Engineering

DDC classification:

621.395 JHA

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Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	6th Floor Silence Zone	Reference	621.395 JHA (Browse shelf(Opens below))	Not For Loan		T0028264

Total holds: 0

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Introduction Fault Models Combinational Logic and Fault Simulation Test Generation for Combinational Circuits Sequential ATPG IDDQ Testing Functional Testing Delay Fault Testing CMOS Testing Fault Diagnosis Design for Testability Built in Self Test Synthesis for Testability Memory Testing High Level Test Synthesis System on a Chip Test Synthesis Index

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