Nanometer Technology Designs High-Quality Delay Tests
Material type:
- 9780387764863
- 621.3950287 TEH
Item type | Current library | Item location | Collection | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|---|
![]() |
NIMA Knowledge Centre | 6th Floor Silence Zone | Reference | 621.3950287 TEH (Browse shelf(Opens below)) | Not For Loan | T0037542 |
Introduction At speed Test Challenges for Nanometer Technology Designs Local At-Speed Scan Enable Generation using Low - Cost Testers Enhanced Launch off Capture Hybrid Scan Based Transition Delay Test Avoiding Functionally Untestable Faults Screening Small Delay Defects Faster Than At Speed Test Considering IR-Drop Effects IR-Drop Tolerant At speed Test Pattern Generation Pattern Generation for Power Supply Noise Analysis Delay Fault Testing in Presence of Maximum Crosstalk Testing SoC Interconnects for Signal Integrity Index
There are no comments on this title.