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Power-Constrained Testing of VLSI Circuits

By: Contributor(s): Material type: TextTextSeries: Frontiers in Electronic TestingPublication details: Boston Kluwer Academic Publishers 2003Description: 178pISBN:
  • 9781402072352
Subject(s): DDC classification:
  • 621.3950287 NIC
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Holdings
Item type Current library Item location Collection Call number Status Date due Barcode Item holds
Reference Book Reference Book NIMA Knowledge Centre 6th Floor Silence Zone Reference 621.3950287 NIC (Browse shelf(Opens below)) Not For Loan T0041435
Total holds: 0

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