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Power Aware Testing and Test Strategies for Low Power Devices

By: Contributor(s): Material type: TextTextPublication details: New York Springer Science+Business Media, Inc 201Description: 363pISBN:
  • 9781441909275
Subject(s): DDC classification:
  • 621.3815 POW
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Item type Current library Item location Collection Call number Status Date due Barcode Item holds
Reference Book Reference Book NIMA Knowledge Centre 6th Floor Silence Zone Reference 621.3815 POW (Browse shelf(Opens below)) Not For Loan T0041434
Total holds: 0

Summary and Objective of the Book About the Editors Preface Contributors Fundamentals of VLSI Testing Power Issues During Test Low Power Test Pattern Generation Power Aware Design for Test Power Aware Test Data Compression and BIST Power Aware System Level Test Planning Low Power Design Techniques and Test Implications Test Strategies forMultivoltage Designs Test Strategies for Gated Clock Designs Test of Power Management Structures EDA Solution for Power Aware Design for Test Summary Index

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