Power Aware Testing and Test Strategies for Low Power Devices
Material type:
- 9781441909275
- 621.3815 POW
Item type | Current library | Item location | Collection | Call number | Status | Date due | Barcode | Item holds | |
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NIMA Knowledge Centre | 6th Floor Silence Zone | Reference | 621.3815 POW (Browse shelf(Opens below)) | Not For Loan | T0041434 |
Total holds: 0
Summary and Objective of the Book About the Editors Preface Contributors Fundamentals of VLSI Testing Power Issues During Test Low Power Test Pattern Generation Power Aware Design for Test Power Aware Test Data Compression and BIST Power Aware System Level Test Planning Low Power Design Techniques and Test Implications Test Strategies forMultivoltage Designs Test Strategies for Gated Clock Designs Test of Power Management Structures EDA Solution for Power Aware Design for Test Summary Index
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